TAF 認證實驗室
06 01 高分子及複合材料
薄膜
M 050 氧氣透過率
ASTM D3985
(0.5 to 1000) cm3 (STP)/m2·day (single cell)
(0.1 to 167) cm3 (STP)/m2·day (six cells combined)
薄膜
M 050 水氣透過率
ASTM F3299 (0.005 to 1) g/(m2·day)
塑膠
T 999 熱傳導係數
ISO 22007-2
(0.1 to 12) W/m·K
室溫
Hall and 4 probe
廠牌型號
| 霍爾效應量測： | Ecopia HMS-3000 Hall Measurement System |
| 四點探針量測： | 示波器：Keithley 2400 SourceMeter® SMU Instruments |
| 探針：Quatek，鍍金探頭，間距1mm |
重要規格
| 霍爾效應量測： | Ecopia HMS-3000 Hall Measurement System |
| 四點探針量測： | Current: ±1.05A ~ 10pA (screen unit µA) |
| Voltage: ±210V ~ 1µV (screen unit mV) | |
| When current @ 1A, voltage compliance = 21V | |
| Resistance 200MΩ ~ 1µΩ (related to the resolution of voltage) |
試片規格
| 霍爾效應量測： | Measurable sample thickness : Less than 2 mm. |
| Measurable size: 5mm x 5mm ~ 20mm x 20mm. | |
| *若導電性不良，可在上面點銀膠。 | |
| 四點探針量測： | Standard size: length&width = 40mm, thickness <0.5mm |
| Length&width limit range: 5mm~100mm | |
| Thickness limit range: 30mm | |
| * measure depth ~ 5mm, depends on material and apply voltege | |
| * minimum thickness: Depends on sample structure strength | |
| *若樣品為鍍膜在基材上，若兩者之間無絕緣層，有可能測到基材與樣品串聯之電阻 |
服務項目
| 霍爾效應量測： | Bulk concentration (/cm3) | Sheet concentration (/cm2) |
| Mobility (cm2/V-s) | Conductivity (1/Ωcm) | |
| Resistivity 電阻率 (Ωcm) | Average Hall Coefficient (cm3/C) | |
| A-C cross Hall coefficient (cm3/C) | B-D cross Hall coefficient (cm3/C) | |
| Magneto-resistance (Ω) | Ratio of vertical/ horizontal | |
| 四點探針量測： | Sheet resistance | (Thickness>5mm can cot calculate) |
| Resistance | ||
| Bulk resistance |
Note:
*請勿量測膠體、液體、或任何潮濕樣品。